出售/回收/维修泰克TektronixP6251探头

出售/回收/维修 泰克Tektronix P6251探头

衰减：5X/50X/带宽：1GHZ/输入阻抗：1 MΩ ||1 MΩ || ≤ 1 pF/50X:

大量泰克探头和附件供您选择，全部都能与业界的示波器匹配。超过 100 种选择，您会找到特定测试应用中所需的示波器探头。

泰克提供各种示波器探头和附件帮助您应对测量挑战：

• 隔离探头

• 低/高带宽光探头

• 为滑轨探头供电

• 电流探头

• 低/高压差分探头

• 无源探头

• 低/高压单端

• 逻辑分析仪探头

The TDP1000, TDP0500, and P6251 High-voltage Differential Probes provide excellent high-speed electrical and mechanical performance required for today's Switch Mode Power Supply (SMPS), CAN/LIN Bus, and high-speed digital system designs.

Key performance specifications

• 1 GHz and 500 MHz probe bandwidth

• <1 pF differential input capacitance

• 1 MΩ differential input resistance

• ±42 v (DC + pk AC) differential input voltage

• >18 dB CMRR (at 250 MHz 50X attenuation)

Key features

• Outstanding electrical performance

• Selectable bandwidth-limiting filters

• DC reject

• Versatile DUT connectivity

• Small compact probe head for probing small geometry circuit elements

• Straight pin, square pin, solder down, variable pitch standard accessories

• Robust design for reliability

• Easy to use

• Connect directly to the TekProbe™ interface oscilloscopes, or to TekConnect® oscilloscopes using TCA-BNC adapter

• Connect directly to oscilloscopes with the TekVPI™ probe interface

• Easy access to scope-displayed probe menu for probe setup control and operating status information

• Remote GPIB/USB probe control through the oscilloscope

• AutoZero – zeros out output offset

• Provides automatic units scaling and readout on the oscilloscope display

• TDP1000, TDP0500

• P6251

Applications

• High-speed switch mode power supply design

• CAN/LIN bus design

• Digital design and characterization

• Manufacturing engineering test

• Research and development

High-voltage differential probes

The TDP1000, TDP0500, and P6251 High-voltage Differential Probes are specifically designed for use with and direct connection to Tektronix oscilloscopes with either the TekVPI™ probe interface, or TekProbe BNC Interface. These probes achieve high-speed signal acquisition and measurement fidelity by solving three traditional measurement challenges:

• Outstanding Electrical Performance

• Versatile Device-Under-Test Connectivity

• Ease of Use